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Charge Trapping Properties and Retention Time in Amorphous Sige/Sio2 Nanolayers
AuthID
P-002-01H
9
Author(s)
Vieira, EMF
·
Diaz, R
·
Grisolia, J
·
Parisini, A
·
Martin Sanchez, J
·
Levichev, S
·
Rolo, AG
·
Chahboun, A
·
Gomes, MJM
Document Type
Article
Year published
2013
Published
in
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
ISSN: 0022-3727
Volume: 46, Issue: 9, Pages: 095306 (5)
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Publication Identifiers
DOI
:
10.1088/0022-3727/46/9/095306
Handle
:
https://hdl.handle.net/1822/23575
SCOPUS
: 2-s2.0-84874039274
Wos
: WOS:000314819500024
Source Identifiers
ISSN
: 0022-3727
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