Image Pos-Processing and Inversion for Eddy Current Crack Detection Problems

AuthID
 P-00M-4K3
2
Author(s)
Document Type
Proceedings Paper
Year published
2016
Published
in 2016 IEEE METROLOGY FOR AEROSPACE (METROAEROSPACE)
Pages: 203-208 (6)
Conference
3Rd Ieee International Workshop on Metrology for Aerospace (Metroaerospace), Date: JUN 21-23, 2016, Location: Univ Studi Firenze, Florence, ITALY, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc, IEEE AESS, Host: Univ Studi Firenze
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Publication Identifiers
Scopus: 2-s2.0-84991810699
Wos: WOS:000389769800038
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