Quantification of Surface Displacements and Electromechanical Phenomena via Dynamic Atomic Force Microscopy

AuthID
 P-00M-55R
6
Author(s)
Jesse, S
·
Yu, P
·
Carmichael, B
·
Kalinin, SV
·
Tselev, A
Document Type
Article
Year published
2016
Published
in NANOTECHNOLOGY, ISSN: 0957-4484
Volume: 27, Issue: 42
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Publication Identifiers
Wos: WOS:000385483900006
Source Identifiers
ISSN: 0957-4484
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