The Metrology System of the Vlti Instrument Gravity

AuthID
P-00M-BEY
27
Author(s)
Lippa, M
·
Gillessen, S
·
Blind, N
·
Kok, Y
·
Yazici, S
·
Weber, J
·
Pfuhl, O
·
Haug, M
·
Kellner, S
·
Wieprecht, E
·
[+7]·
Plattner, M
·
Rau, C
·
Sturm, E
·
Waisberg, I
·
Wiezorrek, E
·
Perrin, G
·
Perraut, K
·
Brandner, W
·
Straubmeier, C
·
3
Editor(s)
Malbet,F;Creech-Eakman,MJ;Tuthill,PG
Document Type
Proceedings Paper
Year published
2016
Published
in OPTICAL AND INFRARED INTERFEROMETRY AND IMAGING V in Proceedings of SPIE, ISSN: 0277-786X
Volume: 9907
Conference
Conference on Optical and Infrared Interferometry and Imaging V, Date: JUN 27-JUL 01, 2016, Location: Edinburgh, SCOTLAND, Sponsors: SPIE
Indexing
Publication Identifiers
Scopus: 2-s2.0-85006868894
Wos: WOS:000390024400057
Source Identifiers
ISSN: 0277-786X
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Name Order Name   Name Order Name   Name Order Name
1 Lippa, M;   2 Gillessen, S;   3 Blind, N;
4 Kok, Y;   5 Yazici, S;   6 Weber, J;
7 Pfuhl, O;   8 Haug, M;   9 Kellner, S;
10 Wieprecht, E;   11 Eisenhauer, F;   12 Genzel, R;
13 Hans, O;   14 Haussmann, F;   15 Huber, D;
16 Kratschmann, T;   17 Ott, T;   18 Plattner, M;
19 Rau, C;   20 Sturm, E;   21 Waisberg, I;
22 Wiezorrek, E;   23 Perrin, G;   24 Perraut, K;
25 Brandner, W;   26 Straubmeier, C;   27 Amorim, A;