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High Immunity Wafer-Level Measurement of Mhz Current
AuthID
P-00M-BR3
6
Author(s)
Dabek, M
·
Wisniowski, P
·
Kalabinski, P
·
Wrona, J
·
Cardoso, S
·
Freitas, PP
Document Type
Article
Year published
2016
Published
in
MEASUREMENT,
ISSN: 0263-2241
Volume: 94, Pages: 474-479 (6)
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Publication Identifiers
DOI
:
10.1016/j.measurement.2016.08.025
Wos
: WOS:000390512100053
Source Identifiers
ISSN
: 0263-2241
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