Relationship Between Nano-Architectured Ti1-X Cu (X) Thin Film and Electrical Resistivity for Resistance Temperature Detectors

AuthID
 P-00M-NBJ
6
Author(s)
Ferreira, A
·
Lopes, C
·
Rodrigues, MS
·
Document Type
Article
Year published
2017
Published
in JOURNAL OF MATERIALS SCIENCE, ISSN: 0022-2461
Volume: 52, Issue: 9, Pages: 4878-4885 (8)
Indexing
Wos®
Scopus®
Crossref®16
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-85007448711
Wos: WOS:000395105500009
Source Identifiers
ISSN: 0022-2461
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service