Publications

Efficient Yield Optimization Method Using a Variable K-Means Algorithm for Analog Ic Sizing

AuthID
P-00N-88H

Author(s)

Canelas, A

Document Type

Proceedings Paper

Year published

2017

Published

in Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

Pages: 1201-1206

Conference

20Th Design, Automation and Test in Europe, Date 2017, Date: 27 March 2017 through 31 March 2017, Sponsors: ACM Special Interest Group on Design Automation (ACM SIGDA);Electronic System Design Alliance (ESDA);et al.;European Design and Automation Association (EDAA);European Electronic Chips and Systems Design Initiative (ECSI);IEEE Council on Electronic Design Automation (CEDA)

Indexing