Publications

AuthID
P-00N-MWN

Author(s)

Capan, I

Brodar, T

Pastuovic, Z

Siegele, R

Makino, T

Snoj, L

Radulovic, V

Demmouche, K

Document Type

Article

Year published

2018

Published

in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979

Volume: 123, Issue: 16

Conference

29Th International Conference on Defects in Semiconductors (Icds), Date: JUL 31-AUG 04, 2017, Location: Matsue, JAPAN

Indexing

Wos^®

Scopus^®

Google Scholar^®

Publication Identifiers

DOI: 10.1063/1.5011124

Scopus: 2-s2.0-85042229849

Wos: WOS:000431147200127

Source Identifiers

ISSN: 0021-8979

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