Open-Circuit Fault Diagnosis in Interleaved Dc-Dc Boost Converters and Reconfiguration Strategy

AuthID
P-00N-RKD
2
Author(s)
Bento, F
·
1
Editor(s)
Zarri,L
Document Type
Proceedings Paper
Year published
2017
Published
in 2017 IEEE 11TH INTERNATIONAL SYMPOSIUM ON DIAGNOSTICS FOR ELECTRICAL MACHINES, POWER ELECTRONICS AND DRIVES (SDEMPED)
Volume: 2017-January, Pages: 394-400 (7)
Conference
Ieee 11Th International Symposium on Diagnostics for Electrical Machines Power Electronics and Drives (Sdemped), Date: AUG 29-SEP 01, 2017, Location: GREECE, Sponsors: IEEE Advancing Technol Human, IEEE Industrial Electron Soc (IES), IEEE Power Electron Soc (PELS), IEEE Industry Applicat Soc (IAS), Tinos Cultural Found, Municipal Tinos, Univ Patras, Michigan State Univ
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Scopus: 2-s2.0-85047162250
Wos: WOS:000426938200057
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