Deflectometry Setup Definition for Automatic Chrome Surface Inspection

AuthID
 P-00N-SJ3
5
Author(s)
Garrote Contreras, E
·
Aldama Gant, D
·
Document Type
Proceedings Paper
Year published
2017
Published
in 2017 22ND IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION (ETFA) in IEEE International Conference on Emerging Technologies and Factory Automation-ETFA, ISSN: 1946-0740
Volume: Part F134116, Pages: 1-4 (4)
Conference
22Nd Ieee International Conference on Emerging Technologies and Factory Automation (Etfa), Date: SEP 12-15, 2017, Location: Limassol, CYPRUS, Sponsors: IEEE, ABB, ies, Univ Cyprus, Dept Elect Comp Engn
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Publication Identifiers
Scopus: 2-s2.0-85044469919
Wos: WOS:000427812000191
Source Identifiers
ISSN: 1946-0740
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