Adaptive Polynomial Regression for Colorimetric Scanner Calibration Using Genetic Algorithms

AuthID
 P-000-71S
2
Author(s)
Document Type
Proceedings Paper
Year published
2005
Published
in 2005 IEEE International Workshop on Intelligent Signal Processing (WISP)
Pages: 22-27 (6)
Conference
Ieee International Workshop on Intelligent Signal Processing (Wisp), Date: SEP 01-03, 2005, Location: Faro, PORTUGAL, Sponsors: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
SCOPUS: 2-s2.0-33749072336
Wos: WOS:000235508300006
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