A Combined Approach to Fault Diagnosis Based on Principal Components and Influence Matrix

AuthID
 P-000-71Z
3
Author(s)
Document Type
Proceedings Paper
Year published
2005
Published
in 2005 IEEE International Workshop on Intelligent Signal Processing (WISP)
Pages: 171-176 (6)
Conference
Ieee International Workshop on Intelligent Signal Processing (Wisp), Date: SEP 01-03, 2005, Location: Faro, PORTUGAL, Sponsors: IEEE Instrumentat & Measurement Soc
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-33749059249
Wos: WOS:000235508300033
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