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New Method for Phase Characterization of Nonlinear Distortion Products
AuthID
P-000-72A
3
Author(s)
Pedro, JC
·
Martins, JP
·
Cabral, PM
Document Type
Proceedings Paper
Year published
2005
Published
in
2005 IEEE MTT-S International Microwave Symposium, Vols 1-4
in
IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST,
ISSN: 0149-645X
Volume: 2005, Pages: 971-974 (4)
Conference
Ieee Mtt-S International Microwave Symposium,
Date:
JUN 11-17, 2005,
Location:
Long Beach, CA,
Sponsors:
IEEE Microwave Theory & Technol Soc
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®
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Metadata
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Publication Identifiers
DOI
:
10.1109/mwsym.2005.1516789
Scopus
: 2-s2.0-33646727894
Wos
: WOS:000234561201093
Source Identifiers
ISSN
: 0149-645X
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