System and Circuit Level Power Modeling of Energy-Efficient 3D-Stacked Wide I/O Drams

AuthID
P-00P-9MN
5
Author(s)
Chandrasekar, K
·
Weis, C
·
Wehn, N
·
Goossens, K
Document Type
Proceedings Paper
Year published
2013
Published
in DESIGN, AUTOMATION & TEST IN EUROPE in Design Automation and Test in Europe Conference and Exhibition, ISSN: 1530-1591
Pages: 236-241 (6)
Conference
Design, Automation and Test in Europe Conference and Exhibition (Date), Date: MAR 18-22, 2013, Location: Grenoble, FRANCE, Sponsors: ACM Special Interest Grp Design Automat, RAS, EDA Consortium, IEEE Council Elect Design Automat, ECSI, European Design & Automat Assoc
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Publication Identifiers
Wos: WOS:000415129400047
Source Identifiers
ISSN: 1530-1591
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