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Reconfigurations and Diffusion of Trivacancy in Silicon
AuthID
P-002-7R4
10
Author(s)
Markevich, VP
·
Peaker, AR
·
Hamilton, B
·
Lastovskii, SB
·
Murin, LI
·
Coutinho, J
·
Markevich, AV
·
Rayson, MJ
·
Briddon, PR
·
Svensson, BG
Document Type
Article
Year published
2012
Published
in
PHYSICA B-CONDENSED MATTER,
ISSN: 0921-4526
Volume: 407, Issue: 15, Pages: 2974-2977 (4)
Conference
26Th International Conference on Defects in Semiconductors (Icds),
Date:
JUL 18-22, 2011,
Location:
Nelson, NEW ZEALAND,
Sponsors:
Univ Canterbury, Ind Res Ltd, MacDiarmid Inst
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®
Scopus
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Publication Identifiers
DOI
:
10.1016/j.physb.2011.08.001
SCOPUS
: 2-s2.0-84862013445
Wos
: WOS:000305790800040
Source Identifiers
ISSN
: 0921-4526
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