Turbulence Level Effects on Conventional Reflectometry Using 2D Full-Wave Simulations

AuthID
 P-00P-JZY
6
Author(s)
Vicente, J
·
Heuraux, S
·
Conway, GD
·
Ribeiro, T
Document Type
Article
Year published
2018
Published
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 89, Issue: 10
Conference
22Nd Biannual Topical Conference on High-Temperature Plasma Diagnostics (Htpd), Date: APR 16-19, 2018, Location: Gen Atom, San Diego, CA, Sponsors: Appl Nanotools, DtAcq Solut, Palomar Sci Instruments, Sydor Technologies, TAE Technologies, Telops, Host: Gen Atom
Indexing
Wos®
Scopus®
Crossref®6
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85052750431
Wos: WOS:000449144500152
Source Identifiers
ISSN: 0034-6748
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service