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A 125 Ms/S 10.4 Enob 10.1 Fj/Cony-Step Multi-Comparator Sar Adc with Comparator Noise Scaling in 65Nm Cmos

AuthID
P-00P-VBW

Author(s)

Liu, SL

Paramesh, J

Pileggi, L

Rabuske, T

Fernandes, J

Document Type

Proceedings Paper

Year published

2018

Published

in ESSCIRC 2018 - IEEE 44TH EUROPEAN SOLID STATE CIRCUITS CONFERENCE (ESSCIRC) in Proceedings of the European Solid-State Circuits Conference, ISSN: 1930-8833

Pages: 22-25 (4)

Conference

44Th Ieee European Solid State Circuits Conference (Esscirc), Date: SEP 03-06, 2018, Location: Dresden, GERMANY, Sponsors: IEEE

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Publication Identifiers

Wos: WOS:000448159800004

Source Identifiers

ISSN: 1930-8833

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A 125 Ms/S 10.4 Enob 10.1 Fj/Cony-Step Multi-Comparator Sar Adc with Comparator Noise Scaling in 65Nm Cmos

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A 125 Ms/S 10.4 Enob 10.1 Fj/Cony-Step Multi-Comparator Sar Adc with Comparator Noise Scaling in 65Nm Cmos

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