Power Transistor Fault Diagnosis in Srm Drives Based on Indexes of Symmetry

AuthID
 P-00Q-6CZ
5
Author(s)
Chen, H
Document Type
Proceedings Paper
Year published
2018
Published
in 2018 16TH BIENNIAL BALTIC ELECTRONICS CONFERENCE (BEC) in Proceedings of the Biennial Baltic Electronics Conference, ISSN: 1736-3705
Conference
16Th Biennial Baltic Electronics Conference (Bec), Date: OCT 08-10, 2018, Location: TALTECH Univ Technol, Tallinn, ESTONIA, Sponsors: IEEE, Eliko, TALTECH, Thomas Johann Seeback Dept Elect, TALTECH, Dept Comp Systems, TALTECH, Mextory, Host: TALTECH Univ Technol
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Publication Identifiers
Wos: WOS:000457625500017
Source Identifiers
ISSN: 1736-3705
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