Locating Defects in Anisotropic Cfrp Plates Using Tof-Based Probability Matrix and Neural Networks

AuthID
 P-00Q-GAK
4
Author(s)
Feng, B
·
Pasadas, DJ
·
Document Type
Article
Year published
2019
Published
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 68, Issue: 5, Pages: 1252-1260 (9)
Indexing
Wos®
Scopus®
Crossref®36
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85064660727
Wos: WOS:000465231600003
Source Identifiers
ISSN: 0018-9456
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