Metallic Filamentary Conduction in Valence Change-Based Resistive Switching Devices: The Case of Tao: X Thin Film with X ∼ 1

AuthID
 P-00R-34G
12
Author(s)
Rosário, CMM
·
Thöner, B
·
Schönhals, A
·
Menzel, S
·
Meledin, A
·
Mayer, J
·
Wuttig, M
·
Waser, R
·
Wouters, DJ
Document Type
Article
Year published
2019
Published
in Nanoscale, ISSN: 2040-3364
Volume: 11, Issue: 36, Pages: 16978-16990
Indexing
Scopus®
Crossref®17
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 31498350
SCOPUS: 2-s2.0-85072509250
Source Identifiers
ISSN: 2040-3364
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service