Printed, Highly Stable Metal Oxide Thin-Film Transistors with Ultra-Thin High-Kappa Oxide Dielectric

AuthID
 P-00R-NPE
8
Author(s)
Carlos, E
·
Leppaniemi, J
·
Sneck, A
·
Alastalo, A
·
Deuermeier, J
·
Document Type
Article
Year published
2020
Published
in ADVANCED ELECTRONIC MATERIALS, ISSN: 2199-160X
Volume: 6, Issue: 3
Indexing
Wos®
Scopus®
Crossref®60
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-85078661524
Wos: WOS:000509772400001
Source Identifiers
ISSN: 2199-160X
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