Detection and Classification of Defects Using Ect and Multi-Level Svm Model

AuthID
 P-00R-RM4
4
Author(s)
Pasadas, DJ
·
Baskaran, P
·
Document Type
Article
Year published
2020
Published
in IEEE SENSORS JOURNAL, ISSN: 1530-437X
Volume: 20, Issue: 5, Pages: 2329-2338 (10)
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Wos®
Scopus®
Crossref®27
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85079664375
Wos: WOS:000522451400010
Source Identifiers
ISSN: 1530-437X
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