Bist Design for Analog Cell Matching

AuthID
 P-002-FCN
6
Author(s)
Cavadas, H
·
Coke, P
·
Malheiro, L
·
Document Type
Proceedings Paper
Year published
2012
Published
in 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) in Proceedings of the European Test Symposium, ISSN: 1530-1877
Conference
17Th Ieee European Test Symposium (Ets), Date: MAY 28-JUN 01, 2012, Location: Annecy, FRANCE, Sponsors: IEEE, IEEE Comp Soc, Gopel Elect, ARM, Qualcomm, IEEE Comp Soc, Test Technol Tech Council (TTTC)
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Publication Identifiers
SCOPUS: 2-s2.0-84864651603
Wos: WOS:000309227500009
Source Identifiers
ISSN: 1530-1877
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