Publications

Deep Attention Model for the Hierarchical Diagnosis of Skin Lesions

AuthID
P-00S-0JE

Author(s)

Barata, C

Marques, JS

Celebi, ME

Document Type

Proceedings Paper

Year published

2020

Published

in 2019 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS (CVPRW 2019) in IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, ISSN: 2160-7508

Volume: 2019-June, Pages: 2757-2765 (9)

Conference

32Nd Ieee/Cvf Conference on Computer Vision and Pattern Recognition (Cvpr), Date: JUN 16-20, 2019, Location: Long Beach, CA, Sponsors: IEEE, CVF, IEEE Comp Soc

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