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Ion Beams as a Tool for the Characterization of Near-Pseudomorphic Cdzno Epilayers
AuthID
P-002-GH5
5
Author(s)
Redondo Cubero, A
·
Brandt, M
·
Henneberger, F
·
Alves, E
·
Lorenz, K
3
Editor(s)
Teherani, FH; Look, DC; Rogers, DJ
Document Type
Proceedings Paper
Year published
2012
Published
in
OXIDE-BASED MATERIALS AND DEVICES III
in
Proceedings of SPIE,
ISSN: 0277-786X
Volume: 8263
Conference
Conference on Oxide-Based Materials and Devices Iii,
Date:
JAN 22-25, 2012,
Location:
San Francisco, CA,
Sponsors:
SPIE
Indexing
Wos
®
Scopus
®
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®
Metadata
Sources
Publication Identifiers
DOI
:
10.1117/12.908496
SCOPUS
: 2-s2.0-84858612426
Wos
: WOS:000303381200018
Source Identifiers
ISSN
: 0277-786X
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