Investigation of Local Conduction Mechanisms in Ca and Ti-Doped Bifeo3 Using Scanning Probe Microscopy Approach

AuthID
P-00S-ANY
7
Author(s)
Document Type
Article
Year published
2020
Published
in NANOMATERIALS, ISSN: 2079-4991
Volume: 10, Issue: 5, Pages: 940 (9)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85086402185
Wos: WOS:000540781800123
Source Identifiers
ISSN: 2079-4991
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