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Class-Specific Interferometric Phase Estimation Using Patch-Based Importance Sampling
AuthID
P-00S-SDR
3
Author(s)
Krishnan, JP
·
Figueiredo, MAT
·
Bioucas Dias, JM
Document Type
Article
Year published
2020
Published
in
IEEE ACCESS,
ISSN: 2169-3536
Volume: 8, Pages: 161052-161066 (15)
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Publication Identifiers
DOI
:
10.1109/access.2020.3021178
SCOPUS
: 2-s2.0-85091268239
Wos
: WOS:000570205800001
Source Identifiers
ISSN
: 2169-3536
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