Ab Initio Study of Height Contrast in Scanning Tunneling Microscopy of Ge/Si Surface Layers Grown on Si(111) in Presence of Bi

AuthID
 P-002-JNF
2
Author(s)
Zhachuk, R
·
Document Type
Article
Year published
2011
Published
in PHYSICAL REVIEW B, ISSN: 1098-0121
Volume: 84, Issue: 19
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-82655188051
Wos: WOS:000297102900004
Source Identifiers
ISSN: 1098-0121
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