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Mechanisms of Damage Formation in Eu-Implanted Gan Probed by X-Ray Diffraction
AuthID
P-002-JZA
6
Author(s)
Lacroix, B
·
Leclerc, S
·
Declemy, A
·
Lorenz, K
·
Alves, E
·
Ruterana, P
Document Type
Article
Year published
2011
Published
in
EPL,
ISSN: 0295-5075
Volume: 96, Issue: 4, Pages: 46002 (5)
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Publication Identifiers
DOI
:
10.1209/0295-5075/96/46002
SCOPUS
: 2-s2.0-81155123751
Wos
: WOS:000297322500032
Source Identifiers
ISSN
: 0295-5075
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