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AUTO-CLASSIFIER: A Robust Defect Detector Based on an Automl Head

AuthID
P-00T-5YG

Author(s)

Lopes, V

Alexandre, LA

Editor(s)

Yang,H;Pasupa,K;Leung,AC;Kwok,JT;Chan,JH;King,I

Document Type

Proceedings Paper

Year published

2020

Published

in Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), ISSN: 0302-9743

Volume: 12532 LNCS, Pages: 137-149

Conference

27Th International Conference on Neural Information Processing, Iconip 2020, Date: 18 November 2020 through 22 November 2020

Indexing

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Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1007/978-3-030-63830-6_12

Scopus: 2-s2.0-85097045940

Source Identifiers

ISSN: 0302-9743

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