Evaluation of Bias Voltage-Dependent Mechanical Properties of Amorphous Tisi2 Thin Films on Peek by Nano-Characterization Techniques

AuthID
 P-00T-CG2
3
Author(s)
Frutos, E
·
Jimenez, JA
Document Type
Article
Year published
2021
Published
in SURFACE & COATINGS TECHNOLOGY, ISSN: 0257-8972
Volume: 409, Pages: 126859 (10)
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85099810229
Wos: WOS:000654045600048
Source Identifiers
ISSN: 0257-8972
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