Sige Layer Thickness Effect on the Structural and Optical Properties of Well-Organized Sige/Sio2 Multilayers

AuthID
P-00T-P3D
12
Author(s)
Vieira, EMF
·
Toudert, J
·
Parisini, A
·
Leitao, JP
·
Franco, N
·
Martín Sánchez, J
·
Serna, R
·
Document Type
Article
Year published
2017
Published
in NANOTECHNOLOGY, ISSN: 0957-4484
Volume: 28, Issue: 34, Pages: 345701 (12)
Indexing
Publication Identifiers
Pubmed: 28628483
SCOPUS: 2-s2.0-85026349587
Wos: WOS:000406266300001
Source Identifiers
ISSN: 0957-4484
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