A Transient Two-Tone Rf Method for the Characterization of Electron Trapping Capture and Emission Dynamics in Gan Hemts

AuthID
 P-00T-TDR
6
Author(s)
Tome, PM
·
Barradas, FM
·
Nunes, LC
·
Gomes, JL
·
Cunha, TR
·
Document Type
Proceedings Paper
Year published
2020
Published
in PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Pages: 428-431 (4)
Conference
Ieee/Mtt-S International Microwave Symposium (Ims), Date: AUG 04-06, 2020, Location: ELECTR NETWORK, Sponsors: IEEE, MTT S, Analog Devices, Cadence, Keysight Technologies, Qorvo, Ciao, AR, Hermet Solut Grp, Mini Circuits, Nl, Renesas, Xilinx, Zymet, Rohde & Schwarz, Everything RF, High Frequency Elect, Microwave Prod Digest, MWEE, RF Globalnet
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Wos®
Publication Identifiers
Wos: WOS:000627746500446
Source Identifiers
ISSN: 0149-645X
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