Functionalized Nanoparticles for Characterization Through Tem Images: Comparison Between Two Innovative Techniques

AuthID
P-00V-2QQ
5
Author(s)
Mi, C
·
Huang, YG
·
Fu, CH
·
Zhang, ZW
·
Document Type
Article
Year published
2021
Published
in IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, ISSN: 1094-6969
Volume: 24, Issue: 4, Pages: 65-76 (12)
Indexing
Publication Identifiers
Wos: WOS:000659548000011
Source Identifiers
ISSN: 1094-6969
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.