Publications

Papr Deviation Impact in the Wideband Power Amplifier Characterization with Realistic Modulated Load-Pull System

AuthID
P-00V-PCE

Author(s)

Chaudhary, S

Jordao, M

Carvalho, NB

Vanden Bossche, M

Cooman, A

Document Type

Proceedings Paper

Year published

2021

Published

in 2021 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X

Volume: 2021-June, Pages: 562-565 (4)

Conference

Ieee Mtt-S International Microwave Symposium (Ims), Date: JUN 07-25, 2021, Location: ELECTR NETWORK, Sponsors: IEEE MTT S,IEEE,RFIC,ARFT G,Analog Devices,Qorvo,Keysight Technologies,ROHDE & SCHWARZ,Wolfspeed,Apitech,Cadence,Copper Mountain Technologies,Eravant,MACOM,Mini Circuits,NIC,Samtec

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