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Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks
AuthID
P-00V-QMM
7
Author(s)
Lopes, F
·
Leal, A
·
Medeiros, J
·
Pinto, MF
·
Dourado, A
·
Dumpelmann, M
·
Teixeira, C
Document Type
Article
Year published
2021
Published
in
IEEE ACCESS,
ISSN: 2169-3536
Volume: 9, Pages: 149955-149970 (16)
Conference
Ieee Access
Indexing
Wos
®
Scopus
®
Crossref
®
20
Handle
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/access.2021.3125728
Handle
:
https://hdl.handle.net/10316/101172
SCOPUS
: 2-s2.0-85119620464
Wos
: WOS:000717765700001
Source Identifiers
ISSN
: 2169-3536
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