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Electro-Thermal and Trapping Characterization of Algan/Gan Rf Power Hemts
AuthID
P-00W-8B6
3
Author(s)
Pedro, J
·
Gomes, J
·
Nunes, L
Document Type
Proceedings Paper
Year published
2021
Published
in
2021 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY SYMPOSIUM (BCICTS)
Conference
Ieee Bicmos and Compound Semiconductor Integrated Circuits and Technology Symposium (Bcicts),
Date:
DEC 06-09, 2021,
Location:
ELECTR NETWORK,
Sponsors:
IEEE
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Wos
®
Scopus
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Crossref
®
2
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/bcicts50416.2021.9682206
SCOPUS
: 2-s2.0-85125795927
Wos
: WOS:000783355500004
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