Latest Advance on Seamless Metal-Semiconductor Contact with Ultralow Barrier in 2D-Material-Based Devices

AuthID
 P-00W-DRM
5
Author(s)
Chen, SY
·
Wang, S
·
Wang, C
·
Liu, Q
Document Type
Review
Year published
2022
Published
in NANO TODAY, ISSN: 1748-0132
Volume: 42
Indexing
Wos®
Google Scholar®
Publication Identifiers
Wos: WOS:000772808700001
Source Identifiers
ISSN: 1748-0132
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service