Detection and Characterization of Defects Using Gmr Probes and Artificial Neural Networks

AuthID
 P-002-VFF
3
Author(s)
Document Type
Article
Year published
2011
Published
in COMPUTER STANDARDS & INTERFACES, ISSN: 0920-5489
Volume: 33, Issue: 2, Pages: 191-200 (10)
Conference
16Th Symposium on Imeko Tc-4/ 13Th International Workshop on Adc Modelling and Testing, Date: SEP 22-24, 2008, Location: Florence, ITALY
Indexing
Wos®
Scopus®
Crossref®26
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-78649980439
Wos: WOS:000285947000012
Source Identifiers
ISSN: 0920-5489
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