Publications

AuthID
P-00W-KAM

Author(s)

Voskerchyan, V

Soares, FM

Diaz Otero, F

Editor(s)

Scheuer,J;Shahriar,SM

Document Type

Proceedings Paper

Year published

2022

Published

in OPTICAL AND QUANTUM SENSING AND PRECISION METROLOGY II in Proceedings of SPIE, ISSN: 0277-786X

Volume: 12016

Conference

Conference on Optical and Quantum Sensing and Precision Metrology Ii, Date: JAN 22-FEB 24, 2022, Location: ELECTR NETWORK, Sponsors: SPIE

Indexing

Wos^®

Scopus^®

Google Scholar^®

Publication Identifiers

DOI: 10.1117/12.2607958

SCOPUS: 2-s2.0-85129888871

Wos: WOS:000825411500022

Source Identifiers

ISSN: 0277-786X

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