X-Ray Photoelectron Spectroscopy and Spectroscopic Ellipsometry Analysis of the P-Nio/N-Si Heterostructure System Grown by Pulsed Laser Deposition

AuthID
 P-00W-M23
11
Author(s)
Chaoudhary, S
·
Dewasi, A
·
Ghosh, S
·
Choudhary, RJ
·
Phase, DM
·
Ganguli, T
·
Rastogi, V
·
Sinopoli, A
·
Aissa, B
·
Mitra, A
Document Type
Article
Year published
2022
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 743, Pages: 139077 (8)
Indexing
Wos®
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-85122192514
Wos: WOS:000786458400003
Source Identifiers
ISSN: 0040-6090
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