A Simple Model for Extraction of Interface State Density of a Schottky Barrier Diode Using Reverse Bias C-V Plots

AuthID
 P-00W-RCC
2
Author(s)
Kal, S
Document Type
Article
Year published
2000
Published
in INTERNATIONAL JOURNAL OF ELECTRONICS, ISSN: 0020-7217
Volume: 87, Issue: 2, Pages: 153-161 (9)
Indexing
Wos®
Scopus®
Crossref®
Unpaywall®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-0034143131
Unpaywall: 10.1080/002072100132291
Wos: WOS:000084753900003
Source Identifiers
ISSN: 0020-7217
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