Publications

Cttb Memory Test Board Single Event Effect Geostationary In-Flight Data Analysis

AuthID
P-00X-7PQ

Author(s)

Pinto, M

Sampaio, JM

Arruda, L

Goncalves, P

Ribeiro, P

Sousa, T

Poivey, C

Bounasser, S

Document Type

Proceedings Paper

Year published

2022

Published

in 2020 20TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS 2020)

Pages: 165-170 (6)

Conference

20Th European Conference on Radiation and Its Effects on Components and Systems (Radecs), Date: JUN 19-23, 2020, Location: ELECTR NETWORK, Sponsors: IEEE,IEEE Nucl & Plasma Sci Soc,Nano Elec,Seibersdorf Labs,Tests & Radiat,3D Plus,Cobham,Renesas,RADECS Assoc

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