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Optical On-Board Metrology in the Athena X-Ray Mission

AuthID
P-00X-DWD

Author(s)

Abreu, MA

Cabral, A

Rebordao, JM

Goncalves, NM

Mottini, S

Pinto, JC

Silva, D

Afonso, J

Matute, I

Oddenino, D

Editor(s)

den Herder,JA;Nakazawa,K;Nikzad,S

Document Type

Proceedings Paper

Year published

2022

Published

in SPACE TELESCOPES AND INSTRUMENTATION 2022: ULTRAVIOLET TO GAMMA RAY in Proceedings of SPIE, ISSN: 0277-786X

Volume: 12181

Conference

Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray Part of Spie Astronomical Telescopes and Instrumentation Conference, Date: JUL 17-22, 2022, Location: Montreal, CANADA, Sponsors: SPIE

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Sources

Publication Identifiers

DOI: 10.1117/12.2630023

SCOPUS: 2-s2.0-85140431462

Wos: WOS:000865607100104

Source Identifiers

ISSN: 0277-786X

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Optical On-Board Metrology in the Athena X-Ray Mission

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