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Optomechanical System for Photonic Chip Characterization
AuthID
P-00Y-EEY
4
Author(s)
Fantoni, A
·
Fernandes, M
·
Fidalgo, J
·
Vieira, M
2
Editor(s)
Soskind,Y;Busse,LE
Document Type
Proceedings Paper
Year published
2023
Published
in
PHOTONIC INSTRUMENTATION ENGINEERING X
in
Proceedings of SPIE,
ISSN: 0277-786X
Volume: 12428
Conference
Conference on Photonic Instrumentation Engineering X,
Date:
JAN 30-FEB 01, 2023,
Location:
San Francisco, CA
Indexing
Wos
®
Scopus
®
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®
Metadata
Sources
Publication Identifiers
DOI
:
10.1117/12.2649210
Scopus
: 2-s2.0-85159781535
Wos
: WOS:001011088400013
Source Identifiers
ISSN
: 0277-786X
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