Opto-Electronic Characterization of Electron Traps upon Forming Polymer Oxide Memory Diodes

AuthID
 P-002-NPS
8
Author(s)
Bory, BF
·
Verbakel, F
·
De Leeuw, DM
·
Tipo de Documento
Article
Year published
2011
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 99, Número: 8, Páginas: 083305 (3)
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Publication Identifiers
SCOPUS: 2-s2.0-80052395014
Wos: WOS:000294359100078
Source Identifiers
ISSN: 0003-6951
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