Multitone Phase And.amplitude Measurement for Nonlinear Device Characterization

AuthID
 P-000-311
2
Author(s)
Document Type
Article
Year published
2005
Published
in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, ISSN: 0018-9480
Volume: 53, Issue: 6, Pages: 1982-1989 (8)
Conference
34Th European Microwave Conference (Eumc), Date: OCT 11-15, 2004, Location: Amsterdam, NETHERLANDS
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Publication Identifiers
SCOPUS: 2-s2.0-23144442155
Wos: WOS:000229850100008
Source Identifiers
ISSN: 0018-9480
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