Publications

A Kalman Filter for Validate Points and Areas of Constant Depth in the Acquisition of the Profile Surfaces

AuthID
P-000-5WA

Author(s)

Fonseca, J

Martins, J

Couto, C

Editor(s)

Franquelo, LG; Malinowski, A; Chow, MY; Hess, HL

Document Type

Proceedings Paper

Year published

2005

Published

in IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3 in IEEE Industrial Electronics Society, ISSN: 1553-572X

Volume: 2005, Pages: 2005-2010 (6)

Conference

31St Annual Conference of the Ieee-Industrial-Electronics-Society, Date: NOV 06-10, 2005-2006, Location: Raleigh, NC, Sponsors: IEEE Ind Elect Soc, NORTEL, Schneider Elect, SICE, NC State Univ, IEEE, Adv Energy, Celisca, NUCOR, EATON

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