Characterisation of Defects in Rare Earth Implanted Gan by Deep Level Transient Spectroscopy

AuthID
 P-000-8ET
11
Author(s)
Marie, P
·
Eimer, S
·
Mechin, L
·
Matias, V
·
Mamor, M
1
Editor(s)
Briot O.Butcher K.S.Gil B.Wetzel C.Yoshikawa A.
Document Type
Article
Year published
2004
Published
in SUPERLATTICES AND MICROSTRUCTURES, ISSN: 0749-6036
Volume: 36, Issue: 4-6, Pages: 713-719 (7)
Conference
Meeting of the European-Materials-Research-Society, Date: MAY 24-28, 2004, Location: Strasbourg, FRANCE, Sponsors: European Mat Res Soc
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-10044244023
Wos: WOS:000225762800038
Source Identifiers
ISSN: 0749-6036
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service