High Quality Ion-Induced Secondary Electron Imaging for Mev Nuclear Microprobe Applications

AuthID
 P-000-BFB
5
Author(s)
Teo, EJ
·
Bettiol, AA
·
Watt, F
·
Document Type
Article
Year published
2004
Published
in JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, ISSN: 1071-1023
Volume: 22, Issue: 2, Pages: 560-564 (5)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-2342509631
Wos: WOS:000221092300018
Source Identifiers
ISSN: 1071-1023
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service